NIMT attends the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities
29 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities. The event hosted by the National Institute of Metrology (NIM), China, in Nanning, Guangxi Zhuang Autonomous Region, the People’s Republic of […]
NIMT delegation attends the 13th ASEAN Expert Group on Metrology Meeting (EGM-13)
23 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT) attended the 13th ASEAN Expert Group on Metrology Meeting (EGM-13) hosted by the National Metrology Institute of Malaysia (NMIM) in Kuala Lumpur, Malaysia. The primary objective of the EGM-13 was to convene the representatives from National Metrology Institutes (NMIs) across ASEAN […]
NIMT Delegation Visits Center for Quantum Technology at National Tsing Hua University
On 24 June 2025, a delegation from NIMT visited the Center for Quantum Technology at National Tsing Hua University, located near CMS in Hsinchu. The visit aimed to explore frontier research in quantum science and its implications for future metrology and precision measurement. The NIMT delegates had the opportunity to tour several of the Center’s […]
NIMT Delegation Visits Innovative Nanotech Inc. to Explore Commercialization of Nanometrology Technologies
On 23 June 2025, a delegation from NIMT visited Innovative Nanotech Inc., a spin-off company of CMS/ITRI. Innovative Nanotech Inc. is known for transforming advanced research in nanometrology and precision measurement into commercially viable products and solutions. The company focuses on nanoscale measurement instrumentation, precision positioning systems, and metrology solutions tailored for the semiconductor and […]
NIMT Delegation Explores Advanced Imaging Technologies at ZEISS Innovation Center
On 23 June 2025, a delegation from NIMT visited the ZEISS Innovation Center to explore cutting-edge microscopy and imaging technologies that support semiconductor and advanced material research. The visit aimed to deepen technical understanding and foster future collaboration in the field of high-resolution imaging and precision measurement. The delegation was welcomed by ZEISS Sr. Application […]
Strengthening Knowledge in Semiconductor Heritage
On 21 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, toured the TSMC Museum of Innovation (MOI) in Hsinchu Science Park. This engaging visit immersed the delegation in the rich history and advanced technologies that underpin modern semiconductor manufacturing. The Museum of Innovation, a premier venue dedicated to showcasing […]
Exploring Innovation: NIMT Participates in Technical Tour on Measurement Science and Medical Metrology
On 20 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, took part in the Technical Tour organized as part of the APMP Mid-Year Meetings 2025. The tour offered an exclusive opportunity to explore the state-of-the-art laboratories at CMS/ITRI and to engage in technical discussions on emerging fields of metrology. […]
NIMT Reinforces Regional Leadership in Green Energy Metrology at APMP Symposium
On 19 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in the Green Energy Symposium – Metrology, Testing and Certification, held at the ITRI Central Region Campus in Nantou. This international forum was part of the APMP Mid-Year Meetings 2025 and focused on the vital role of metrology […]
NIMT Contributes to Semiconductor Innovation at ASMF 2025
On 17 June 2025, the delegates from NIMT proudly participated in the Advanced Semiconductor Metrology Forum (ASMF), held at the ITRI Kuang-Fu Campus in Hsinchu, as part of the APMP Mid-Year Meetings 2025. Dr. Jariya Buajarern, Metrologist Expert at NIMT, was invited as a distinguished speaker in Session IV: Worldwide View of Semiconductor Metrology, where […]
NIMT organizes the training on elemental analysis techniques in water and food samples
Dr. Sutthinun Taebunpakul, Group Leader of Inorganic Analysis, along with Dr. Nattikarn Ornthai, Dr. Nunnapus Laitip, and Ms. Usana Leekriangkrai—metrologists from the Inorganic Analysis Group, Chemical Metrology and Biometry Department—cordially welcomed Mr. Larson Kitao and Mr. Lewis Lepani from the Papua New Guinea National Fisheries Authority, and Mr. Justin Narimbi from the Papua New Guinea […]