Exploring Innovation: NIMT Participates in Technical Tour on Measurement Science and Medical Metrology

On 20 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, took part in the Technical Tour organized as part of the APMP Mid-Year Meetings 2025. The tour offered an exclusive opportunity to explore the state-of-the-art laboratories at CMS/ITRI and to engage in technical discussions on emerging fields of metrology.

The morning session featured visits to four key laboratory facilities that demonstrated cutting-edge national measurement standards:
– Silicon-Sphere Kilogram Standard – showcasing the redefined realization of mass based on fundamental constants.
– Calibration System for Coordinate Measuring Machines (CMMs) – highlighting high-precision dimensional metrology techniques.
– Quantized Hall Resistance Standard – representing electrical resistance based on quantum phenomena.
– Acoustic Gas Thermometry – a primary method for high-accuracy temperature measurement using acoustic principles.

In the afternoon, the NIMT delegation visited the Nanometrology and Automated Optical Inspection laboratories, which presented the latest developments in nanoscale measurements and automated quality control systems.

The tour concluded with a focused technical meeting on medical metrology, where experts from CMS introduced ongoing developments in:
– Medical device evaluation,
– Molecular-level biosensor technologies, and
– A roundtable discussion

 

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