On 17 June 2025, the delegates from NIMT proudly participated in the Advanced Semiconductor Metrology Forum (ASMF), held at the ITRI Kuang-Fu Campus in Hsinchu, as part of the APMP Mid-Year Meetings 2025.
Dr. Jariya Buajarern, Metrologist Expert at NIMT, was invited as a distinguished speaker in Session IV: Worldwide View of Semiconductor Metrology, where she delivered a presentation on “Advanced Materials Science and Technology – Opportunities and Challenges for Thailand.” Her talk emphasized Thailand’s strategic direction in advanced materials research, the growing demands in semiconductor-related metrology, and how emerging technologies can position Thailand as a competitive player in the global semiconductor value chain.
Also representing NIMT at the forum was Dr. Sivinee Sawatdiaree, Head of the Electrical Metrology Department. Her participation supported NIMT’s commitment to keeping pace with international advancements in semiconductor technologies and strengthening partnerships across the Asia-Pacific metrology community.
The ASMF serves as an international platform for dialogue among leading experts from national metrology institutes, industry, and academia, focusing on critical topics such as nanometrology, advanced packaging, and materials purity. The 2025 forum placed particular emphasis on next-generation semiconductor manufacturing at 2 nm nodes and beyond, aligning with global trends in AI, quantum technologies, and ultra-precise fabrication.
NIMT’s active contribution to this high-profile event reflects its ongoing mission to support industrial innovation and ensure measurement capabilities that meet the demands of Thailand’s future technologies.
