News

NIMT delegation visits Shenzhen En Plus Tech Co., Ltd.

31 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in a technical visit to Shenzhen En Plus Tech Co., Ltd. located in Shenzhen. The visit was organized as part of the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities, hosted […]

NIMT delegation visits INFY Power

31 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in a technical visit to INFY Power located in Shenzhen. The visit was organized as part of the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities, hosted by NIM China. During […]

NIMT delegation visits Guangxi Institute of Metrology and Test (GXIMT)

30 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in a technical visit to Guangxi Institute of Metrology and Test (GXIMT). The visit was organized as part of the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities, hosted by the […]

NIMT delegation visits China Southern Power Grid

30 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in a technical visit to China Southern Power Grid. The visit was part of the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities, hosted by the NIM in Nanning, Guangxi Zhuang […]

NIMT and NIM sign MOU to strengthen collaboration in the field of metrology

29 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in the signing ceremony of Memorandum of Understanding (MOU) between the National Institute of Metrology (Thailand) (NIMT) and the National Institute of Metrology (NIM), China. The ceremony took place during the 5th […]

NIMT attends the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities

29 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT), led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, participated in the 5th Lancang-Mekong Cooperation Symposium in Metrology and Related Activities. The event hosted by the National Institute of Metrology (NIM), China, in Nanning, Guangxi Zhuang Autonomous Region, the People’s Republic of […]

NIMT delegation attends the 13th ASEAN Expert Group on Metrology Meeting (EGM-13)

23 July 2025 – A delegation from the National Institute of Metrology (Thailand) (NIMT) attended the 13th ASEAN Expert Group on Metrology Meeting (EGM-13) hosted by the National Metrology Institute of Malaysia (NMIM) in Kuala Lumpur, Malaysia. The primary objective of the EGM-13 was to convene the representatives from National Metrology Institutes (NMIs) across ASEAN […]

NIMT Delegation Visits Center for Quantum Technology at National Tsing Hua University

On 24 June 2025, a delegation from NIMT visited the Center for Quantum Technology at National Tsing Hua University, located near CMS in Hsinchu. The visit aimed to explore frontier research in quantum science and its implications for future metrology and precision measurement. The NIMT delegates had the opportunity to tour several of the Center’s […]

NIMT Delegation Visits Innovative Nanotech Inc. to Explore Commercialization of Nanometrology Technologies

On 23 June 2025, a delegation from NIMT visited Innovative Nanotech Inc., a spin-off company of CMS/ITRI. Innovative Nanotech Inc. is known for transforming advanced research in nanometrology and precision measurement into commercially viable products and solutions. The company focuses on nanoscale measurement instrumentation, precision positioning systems, and metrology solutions tailored for the semiconductor and […]

NIMT Delegation Explores Advanced Imaging Technologies at ZEISS Innovation Center

On 23 June 2025, a delegation from NIMT visited the ZEISS Innovation Center to explore cutting-edge microscopy and imaging technologies that support semiconductor and advanced material research. The visit aimed to deepen technical understanding and foster future collaboration in the field of high-resolution imaging and precision measurement. The delegation was welcomed by ZEISS Sr. Application […]