NIMT Experts Contribute to Global Discussions on Metrology and Digitalization at FORUM-MD 2026, France

Dr. Jariya Buajarern, Expert Metrologist, as Chair of CCL-TG-DIG, together with Dr. Narin Chanthawong, Group Leader of Nano Metrology from NIMT, represented Thailand at the 3rd Meeting of the Forum on Metrology and Digitalization (FORUM-MD) held from 9–13 March 2026 in France.

The meeting, hosted at the International Bureau of Weights and Measures (BIPM) headquarters in Sèvres, France, brought together leading representatives from national metrology institutes and international organizations to advance global collaboration in digital transformation within the field of metrology.

The FORUM-MD program comprised a series of technical sessions, including Working Group, Task Group, and Discussion Group meetings (9–10 March), followed by a specialized workshop on “AI in a metrology context: AI for metrology and metrology for AI” (11 March), and culminating in the plenary meeting held on 12–13 March 2026.

Key agenda items during the plenary meeting included updates from the International Committee for Weights and Measures (CIPM) and BIPM, progress on the BIPM Roadmap on Digitalization, reports from various working and task groups, and discussions on the governance and future direction of FORUM-MD.

In this important international forum, Dr. Narin Chanthawong was selected as the Chair of the FORUM-MD Task Group on Harmonizing DCC and DRMC. This appointment reflects international recognition of Thailand’s expertise and active role in advancing digital metrology.

The participation and leadership roles of NIMT experts in FORUM-MD not only strengthen Thailand’s presence in the global metrology community but also support the institute’s strategic direction toward digital transformation. The outcomes of this meeting will contribute to enhancing the development and harmonization of digital metrology systems, ensuring alignment with international standards and fostering innovation in measurement science.

Photo credit: © BIPM

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