Mr. Siriwat Kitsompong, the researcher from the National Institute of Metrology (Thailand) (NIMT), presented his research at the 11th International Conference of the Asian Society for Precision Engineering and Nanotechnology (ASPEN 2025), held in Chinese Taipei from 25–28 November 2025.
At the conference, Mr. Siriwat delivered a technical presentation entitled “Development of a Jig and Fixture for Measuring Squareness Error and Estimating Measurement Uncertainty.” The study introduces the design of a jig and fixture for evaluating straightness and squareness errors in two-dimensional measuring systems in accordance with ISO 230-1, supporting both contact and non-contact measurement methods. The work also addresses the estimation of measurement uncertainty, contributing to improved accuracy and reliability in dimensional metrology applications.
ASPEN 2025, organized by the Asian Society for Precision Engineering and Nanotechnology, serves as a key international platform for researchers and industry experts across Asia to exchange knowledge and showcase advancements in precision engineering and nanotechnology.
Mr. Siriwat’s contribution reflects the institute’s ongoing commitment to advancing metrology research and strengthening Thailand’s presence in the global scientific community.
