On the auspicious occasion of 150th anniversary of Metre Convention, NIMT proudly joined the global metrology community in celebrating this remarkable scientific milestone and made a significant contribution in emphasizing the importance of accurate measurement for international trade, sustainable development and its impact on addressing global challenges at all levels.
A key highlight of the event was the poster session, where NIMT was honored to present the following contributions:
- Dr. Oijai Ongrai‘s poster titled “Collaborative Metrology Efforts for Sustainable Energy Solutions in the Asia-Pacific”, under the theme of Energy.
- Miss Benjarat Nganslung‘s paper, “Preliminary Study of Characteristics of Microplastic Reference Material”, accepted in Session 2 – The Environment and Climate Change.
- Miss Praiya Thongluang‘s paper, “The Evolution of Digital Calibration Certificates (DCC) in NIMT”, accepted in Session 7 – Digital Transformation, Artificial Intelligence, and System Metrology.
Dr. Oijai’s poster was selected by a panel of CIPM members as one of nine outstanding posters. With support from the BIPM, she was invited to deliver a two-minute presentation of her paper on Wednesday, 21 May 2025, at Palais des Congrès in Versailles, France.
Another noteworthy contribution was the special session on World Metrology Day, during which our distinguished expert, Miss Rugkanawan Wongpithayadisai, was invited to deliver a formal message of congratulations as part of the anniversary celebration. As Chair of the TCQS, she articulated a visionary perspective that highlighted the pivotal role of quality management systems in metrology in driving economic progress, social development, and quality of life.
NIMT’s contribution to this celebration reflected its commitment to gender equity and the promotion of young metrologists as role models on the international stage.
