Dr. Narin Chanthawong, Group Leader of Nano Metrology from Dimensional Metrology Department, attended the 2nd meeting of Forum on Metrology and Digitalization (FORUM-MD) and related Task Groups held on 17 – 21 February 2025 at BIPM Headquarters in Sèvres, France.
During the meeting, Dr. Narin presented the advancements in digital metrology and NIMT’s research contributions. The forum provided valuable insights into the latest advancements and perspectives on digital metrology. It also enabled the establishment of NIMT’s strategic framework for the development of digital metrology to align with the international standards. In addition, it cultivated the relationships with other National Metrology Institutes (NMIs) and facilitated the planning of future collaboration.
