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NIMT News
NIMT Delegation Visits Innovative Nanotech Inc. to Explore Commercialization of Nanometrology Technologies
On 23 June 2025, a delegation from NIMT visited Innovative Nanotech Inc., a spin-off company of CMS/ITRI. Innovative Nanotech Inc. is known for transforming advanced research in nanometrology and precision measurement into commercially viable products and solutions. The company focuses on nanoscale measurement instrumentation, precision positioning systems, and metrology solutions tailored for the semiconductor and […]
NIMT Delegation Explores Advanced Imaging Technologies at ZEISS Innovation Center
On 23 June 2025, a delegation from NIMT visited the ZEISS Innovation Center to explore cutting-edge microscopy and imaging technologies that support semiconductor and advanced material research. The visit aimed to deepen technical understanding and foster future collaboration in the field of high-resolution imaging and precision measurement. The delegation was welcomed by ZEISS Sr. Application […]
Strengthening Knowledge in Semiconductor Heritage
On 21 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, toured the TSMC Museum of Innovation (MOI) in Hsinchu Science Park. This engaging visit immersed the delegation in the rich history and advanced technologies that underpin modern semiconductor manufacturing. The Museum of Innovation, a premier venue dedicated to showcasing […]
Exploring Innovation: NIMT Participates in Technical Tour on Measurement Science and Medical Metrology
On 20 June 2025, the delegates from NIMT, led by Pol.Lt.Gen. Pornchai Suteerakune, Director of NIMT, took part in the Technical Tour organized as part of the APMP Mid-Year Meetings 2025. The tour offered an exclusive opportunity to explore the state-of-the-art laboratories at CMS/ITRI and to engage in technical discussions on emerging fields of metrology. […]
